New X-ray imaging technique could double scanning efficiency while revealing hidden detail
Automated news aggregation. Headlines and summaries are gathered from public feeds; see our editorial standards for sourcing, corrections, and AI-assist disclosure.
Researchers at Monash University have developed a new X-ray imaging technique that can image two overlapping samples at the same time, potentially doubling scanning efficiency while opening new possibilities for industrial inspection and scientific research.
About this story
This story was aggregated from Phys.org. Headlines, summaries, and links are gathered automatically from public RSS feeds for your convenience.
Read the full story →For agents:JSON recordOpenAPIWebMCPllms.txt